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    基于纳米操作机的多晶ZnO晶界电学特性研究

    Study on Electrical Properties of Polycrystalline ZnO Grain Boundary with a SEM-based Nanomanipulator

    • 摘要: 文中基于安装在扫描电子显微镜(Scanning Electron Microscopy, SEM)中的纳米操作机,对具有微米级细晶粒的氧化锌(ZnO)压电陶瓷进行了单晶粒边界的直接电学测量。由纳米操作机操纵的双探针作为微电极夹在机械手上,测量了ZnO压电陶瓷晶界的伏安特性曲线、非线性系数以及20个晶粒的平均尺寸。在20 Hz~1 MHz的频率范围内,通过等效电路拟合,以阻抗复平面表示实验数据。实验表明低频直流高阻阻抗的本质可归因于晶界,同时20 Hz下的电阻分布可用于预测ZnO压电陶瓷在某些较低频率下的阻抗特性。

       

      Abstract: Direct electrical measurement of single grain boundary of ZnO piezoelectric ceramics with micron fine grains is carried out based on the nanomanipulator installed in the scanning electron microscopy(SEM). With two probes clamped on the manipulator as microelectrodes, the volt ampere characteristic curve, nonlinear coefficient of ZnO piezoelectric ceramics grain boundary and the average size of twenty grains are measured. The experimental data are represented by impedance complex plane through equivalent circuit fitting in the frequency range from 20 Hz to 1 MHz. The result shows that the essence of low-frequency direct circuit high resistance impedance can be attributed to grain boundary and the electrical resistances distribution at 20 Hz can be used to predict the impedance characteristics of ZnO piezoelectric ceramics at some lower frequencies.

       

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